Parag K. Lala digital circuits, logic circuit testing, VLSI, fault detection, design- for-testability, chapter also discusses test generation for sequential circuits. Digital circuit testing and testability by Parag K. Lala, , Academic Press edition, in English. Get this from a library! Digital circuit testing and testability. [Parag K Lala].
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Digital Circuit Testing and Testability
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Digital circuit testing and testability
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Search WorldCat Find items in libraries near you. Subjects Integrated circuitsTestingVery large scale integrationDigital integrated circuitsFault tolerance. Please enter recipient e-mail ciruit es.
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Digital Circuit Testing and Testability by Parag K. Lala
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